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13.3 Internal Test Procedures Devices according VDE 0701/0702 (Protection Class III)
08/ 2012
. chargers, ains supply units
13.g.2 Internal Test Procedures for Devices according VDE 0701/0702 (Protection Class II)
1
D evice lass ith lnsu (500 V), functional test ith ont (differential current
m easurem ent),
2 evice lass ith lnsu (500 V), ont (alternative easurem ent)
3
D evice lass ith overvoltage arrester, lnsu (250 V), functional test ith ICont
(differential curren easurem ent)
4
D evice lass itho lnsu, functional test ith ont (differential current
m easurem ent), test procedure itho lnsu, only ith justification
5
D evice lass itho lnsu, ont (direct easurem ent), functional test ith ont
(differential curren easurem ent), test procedure itho lnsu, only ith justification
6
D evice lass ith lnsu-3 sec.), functional test ith ont (differential cur
rent easurem ent), seco ndary output, e