Usměrňovačové systémy DC-Měniče Střídače UPS systémy ...
Poznámky redaktora
Rlnsu
(500V), IPE (alternative easurem ent), line test
S hock-proof cable and overvoltage arrester, (200m overall resistance
from (I/A), preset length l=5 cross-section =1.
com letely insulated coffee achine ith conn ector lass itho accessible
PE contact
D evice lass ith heating elem ents <3.g.5 m/0. IPE (differential curren easurem ent, probe itched off)
D evice lass ith RPE (200 A), lnsu (500V), IPE (alternative easurem ent),
no functional test, for easurem ent heating devices, devices itho itch-m ode
pow supplies, ree -phase devices via adap ter 0441 044123
D evice lass ith (10 A), lnsu (500V), IPE (alternative easurem ent), for
testing exte nsion cable ith 300 such pow screw drivers,
grinding tools etc. lnsu (250V), IPE (alternative easurem ent), line test
3.1 ax.5 m/0.5 kW, lnsu (500V, >0.1 ax.g. IPE (differential curren easurem ent, probe itched off), at
seco ndary output, e.3 MQ), functional
test incl.1
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BENNING A
D evice lass ith RPE (200 A), lnsu (500 V), functional test ith IPE (differen
tial curren easurem ent, probe itched off)
D evice lass ith (10 A), lnsu (500 V), functional test ith IPE (differential
curren easurem ent, probe itched off)
D evice lass ith (200 A), lnsu (500 V), ont (direct), functional with
IPE (differential curren easurem ent, probe itched off)
D evice lass ith functional earth, itho PE, lnsu (500 V), ont directly, e. ains supply units, chargers
T hree -phase device lass via adapter 0441 22/044 123: (200 mA) Rlnsu
(500V) eans and adap ter 0441 27/044 128: IPE (clam easurem ent)
T hree -phase device lass via adapter 0441 22/044 123: RPE (10 lnsu (500V)
by eans and adap ter 044127/044 128: IPE (clam easurem ent)
S hock-proof cable (200m lim iting value from (I/A), preset length l=5m ,
cross-section =1.5 overall resistance: 0,3 per
7.5 overall resistance: 0,3 per 7.
D evice lass ith overvoltage arresters ith RPE (200 A), lnsu (250 V), func
tional test ith IPE (differential current easurem ent, probe itched off)
D evice lass ith (200 A), itho lnsu, functional test ith IPE (diffe
rential curren easurem ent, probe itched off), test procedure ith lnsu, only
w ith justification
D evice lass ith (200 A), itho lnsu, ont (direct easurem ent),
functional ith IPE (differential curren easurem ent, probe itched off), test
procedure ith lnsu, only ith justification
D evice lass ith (200m Rlnsu(SOOV), ont (direct easurem ent),
functional incl
